Application Description

Non-contact atomic force microscopy (NC-AFM), also known as dynamic force microscopy (DFM), is the AFM mode that historically has achieved the highest microscopy resolution, down to sub-atomic levels, in real space. Most NC-AFM applications are performed in ultra-high vacuum (UHV) and/or in a low-temperature environment to benefit from high Q-factor sensitivity; this is especially relevant when dealing with short-range forces or atomic-scale imaging. Tracking the resonance frequency enables a faster response compared to open-loop techniques in similar conditions, and brings in the additional advantage of quantitative resonance enhancement.